A batch of 500 wafers has 80 with scratches, 65 with misalignment, and 30 with both. The fraction with at least one defect is not but . Forget the overlap and you overcount by 26%.
A sample space is the set of all possible outcomes of a random experiment. Every subset of is an event.
You need four set operations:
- Union , outcomes in or or both
- Intersection , outcomes in both and
- Complement , outcomes in not in
- Difference , outcomes in but not
For two events, the Venn diagram has four mutually exclusive regions:
- , both occur
- , only
Common mistakes
- Forgetting to subtract the intersection. With and , writing double-counts the overlap. Trap: 0.21 instead of 0.17.
- Sign error in three-event inclusion-exclusion. The triple intersection must be added back. Omitting it gives . Trap: 0.75 or its complement 0.25.
- Confusing "at least one" with "exactly one." . . Trap: giving 0.17 when asked for exactly one.
Bottom line
- Inclusion-exclusion: ; for three events add back the triple intersection.
- Complement rule: , fastest path to "at least one" or "none."
- De Morgan's Laws: and ; complementing flips the operation.
- Partition formula: if partition , then .
Exam shortcut
When you see two or three named events with given probabilities, draw the Venn diagram immediately, fill the innermost intersection first, subtract outward, and verify all regions sum to 1. "PIE" for inclusion-exclusion: Plus singles, Intersection pairs subtracted, Everything-together added back. "Break the bar, flip the sign" for De Morgan's: complementing across a union flips it to an intersection (and vice versa).
The full lesson (about 3,740 words, 25 min read) adds 5 worked examples, all 9 common mistakes, a self-check, free in the app.
Learning objectives
- 1a
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